Source: Ron Smith, FARM PROGRESS, 1/27/20


Extension entomologists from across the Cotton Belt expressed concern that using the three-gene Bt trait in corn could lead to resistance. The five entomologists participating in an insect management panel discussion at the recent Cotton Consultants' Conference, part of the annual Beltwide Cotton Conferences in Austin, Texas, also expressed optimism for new traits targeting lygus and thrips.

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